| Image | Mfr Part # | Series | Package | Product Status | Mounting Type | Package / Case | Supplier Device Package | Operating Temperature | Logic Type | Supply Voltage | Number of Bits |
|---|---|---|---|---|---|---|---|---|---|---|---|
|
SN74SSTVF16857VR
IC REG BUFF 14BIT SSTL 48-TVSOP
|
74SSTVF | Tape & Reel (TR) | Obsolete | Surface Mount | 48-TFSOP (0.173", 4.40mm Width) | 48-TVSOP | 0°C ~ 70°C | Registered Buffer with SSTL_2 Compatible I/O for DDR | 2.3V ~ 2.7V | 14 |
|
SN74LVTH182512DGGR
IC SCAN-TEST-DEV/XCVR 64-TSSOP
|
74LVTH | Tape & Reel (TR) | Active | Surface Mount | 64-TFSOP (0.240", 6.10mm Width) | 64-TSSOP | -40°C ~ 85°C | ABT Scan Test Device With Universal Bus Transceivers | 2.7V ~ 3.6V | 18 |
|
SN74LVT8980ADWR
IC TEST-BUS CONTROLLER 24-SOIC
|
74LVT | Tape & Reel (TR) | Active | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | -40°C ~ 85°C | Embedded Test-Bus Controllers | 2.7V ~ 3.6V | 8 |
|
SN74ABT8543DWRE4
IC SCAN TEST DEVICE 28-SOIC
|
74ABT | Tape & Reel (TR) | Obsolete | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | -40°C ~ 85°C | Scan Test Device with Registered Bus Transceiver | 4.5V ~ 5.5V | 8 |
|
SN74ABTH18652APM
IC SCAN-TEST-DEV/TXRX 64-LQFP
|
74ABTH | Bulk | Active | Surface Mount | 64-LQFP | 64-LQFP (10x10) | -40°C ~ 85°C | Scan Test Device With Transceivers And Registers | 4.5V ~ 5.5V | 18 |
|
SN74BCT8374ADWR
IC SCAN TEST DEVICE W/FF 24-SOIC
|
74BCT | Tape & Reel (TR) | Obsolete | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 0°C ~ 70°C | Scan Test Device with D-Type Edge-Triggered Flip-Flops | 4.5V ~ 5.5V | 8 |
|
LM9780CCVS/NOPB
NON-STANDARD PART CALL FIRST
|
- | Bulk | Active | - | - | - | - | - | - | - |
|
|
JM38510/34201BEA
54F283 4-BIT BINARY FULL ADDERS
|
* | Bulk | Active | - | - | - | - | - | - | - |
|
5962-9172701Q3A
SN54BCT8374A SCAN TEST DEVICES W
|
* | Bulk | Active | - | - | - | - | - | - | - |
|
SN74F1016DW
IC DIODE ARRAY RC TERM 20-SOIC
|
74F | Bulk | Active | Surface Mount | 20-SOIC (0.295", 7.50mm Width) | 20-SOIC | 0°C ~ 70°C | Schottky Barrier Diode Bus-Termination Array | - | 16 |
|
SN74BCT8373ADW
IC SCAN TEST DEVICE LATCH 24SOIC
|
74BCT | Bulk | Active | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 0°C ~ 70°C | Scan Test Device with D-Type Latches | 4.5V ~ 5.5V | 8 |
|
CD4089BEE4
CD4089B CMOS BINARY RATE MULTIPL
|
* | Bulk | Active | - | - | - | - | - | - | - |