| Image | Mfr Part # | Series | Package | Product Status | Mounting Type | Package / Case | Supplier Device Package | Operating Temperature | Logic Type | Supply Voltage | Number of Bits |
|---|---|---|---|---|---|---|---|---|---|---|---|
|
SN74LS396N
LOGIC CIRCUIT, TTL, PDIP16
|
* | Bulk | Active | - | - | - | - | - | - | - |
|
SN74ALS632BN
ERROR DETECTION, ALS SERIES
|
* | Bulk | Active | - | - | - | - | - | - | - |
|
SN74F283NSR
IC FULL ADDER 4BIT BIN 16SO
|
- | - | - | - | - | - | - | - | - | - |
|
SN74LVTH182502APMR
IC SCAN-TEST-DEV/TRANSCVR 64LQFP
|
74LVTH | Tape & Reel (TR) | Active | Surface Mount | 64-LQFP | 64-LQFP (10x10) | -40°C ~ 85°C | ABT Scan Test Device With Universal Bus Transceivers | 2.7V ~ 3.6V | 18 |
|
SN74283N
ADDER/SUBTRACTOR, 4-BIT, TTL
|
* | Bulk | Active | - | - | - | - | - | - | - |
|
SN74GTLP2034DGVR
IC REG TXRX LVTTL-GTLP 48-TVSOP
|
- | - | - | - | - | - | - | - | - | - |
|
5962-9174601QLA
SCAN TEST DEVICES WITH OCTAL BUF
|
54BCT | Tube | Active | Through Hole | 24-CDIP (0.300", 7.62mm) | 24-CDIP | -55°C ~ 125°C | Scan Test Device with Inverting Buffers | 4.5V ~ 5.5V | 8 |
|
54F181SDMQB
ALU, F/FAST SERIES, 4-BIT, TTL
|
54F | Bulk | Active | Through Hole | 24-CDIP (0.300", 7.62mm) | 24-CDIP | -55°C ~ 125°C | Arithmetic Logic Unit | 4.5V ~ 5.5V | 4 |
|
SN74SSTUB32866NMJR
IC CONFIG REG BUFF 25BIT 96-BGA
|
74SSTUB | Tape & Reel (TR) | Active | Surface Mount | 96-LFBGA | 96-NFBGA (13.5x5.5) | -40°C ~ 85°C | Configurable Buffer with Address-Parity Test | 1.7V ~ 1.9V | 25, 14 |
|
CD4089BF3A
CMOS BINARY RATE MULTIPLIER
|
* | Bulk | Active | - | - | - | - | - | - | - |
|
SN74LS283D
ADDER/SUBTRACTOR
|
74LS | Tube | Obsolete | Surface Mount | 16-SOIC (0.154", 3.90mm Width) | 16-SOIC | 0°C ~ 70°C | Binary Full Adder with Fast Carry | 4.75V ~ 5.25V | 4 |
|
SN74LS292N
IC PROG FREQ DIV/TIMER 16-DIP
|
74LS | Tube | Active | Through Hole | 16-DIP (0.300", 7.62mm) | 16-PDIP | 0°C ~ 70°C | Programmable Frequency Dividers/Digital Timers | 4.75V ~ 5.25V | - |