| Image | Mfr Part # | Series | Package | Product Status | Mounting Type | Package / Case | Supplier Device Package | Operating Temperature | Logic Type | Supply Voltage | Number of Bits |
|---|---|---|---|---|---|---|---|---|---|---|---|
|
100181DCQR
ALU, 100K SERIES
|
- | Bulk | Active | Through Hole | 24-CDIP (0.600", 15.24mm) | 24-CDIP | 0°C ~ 85°C | Arithmetic Logic Unit | -4.2V ~ -5.7V | 4 |
|
74LVC161284DLRG4
IC 19BIT BUS INTERFACE 48-SSOP
|
74LVC | Tape & Reel (TR) | Obsolete | Surface Mount | 48-BSSOP (0.295", 7.50mm Width) | 48-SSOP | 0°C ~ 70°C | IEEE STD 1284 Translation Transceiver | 3V ~ 3.6V | 19 |
|
93S42DM
LOGIC CIRCUIT
|
- | Bulk | Active | Through Hole | 16-CDIP (0.300", 7.62mm) | 16-CDIP | -55°C ~ 125°C | Look-ahead Carry Generator | 4.5V ~ 5.5V | 4 |
|
|
CD4527BNS
PROTOTYPE
|
- | Bulk | Active | Surface Mount | 16-SOIC (0.209", 5.30mm Width) | 16-SO | -55°C ~ 125°C | Binary Rate Multiplier | 3V ~ 18V | 4 |
|
|
5962-9758701QEA
4-BIT BINARY FULL ADDERS WITH FA
|
54F | Tube | Active | Through Hole | 16-CDIP (0.300", 7.62mm) | 16-CDIP | -55°C ~ 125°C (TA) | Binary Full Adder with Fast Carry | 4.5V ~ 5.5V | 4 |
|
|
93S42DC
LOGIC CIRCUIT
|
- | Bulk | Active | Through Hole | 16-CDIP (0.300", 7.62mm) | 16-CDIP | 0°C ~ 70°C | Look-ahead Carry Generator | 4.75V ~ 5.25V | 4 |
|
SN74ACT8990FN
IC TEST-BUS CONTROLLER 44-PLCC
|
74ACT | Bulk | Active | Surface Mount | 44-LCC (J-Lead) | 44-PLCC (16.58x16.58) | 0°C ~ 70°C | Test Bus Controller | 4.5V ~ 5.5V | 16 |
|
SN74BCT8240ANTG4
IC SCAN TEST DEVICE BUFF 24-DIP
|
74BCT | Tube | Obsolete | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 0°C ~ 70°C | Scan Test Device with Inverting Buffers | 4.5V ~ 5.5V | 8 |
|
|
5962-9174601Q3A
SCAN TEST DEVICES WITH OCTAL BUF
|
54BCT | Tube | Active | Surface Mount | 28-CLCC | - | -55°C ~ 125°C | Scan Test Device with Inverting Buffers | 4.5V ~ 5.5V | 8 |
|
SN74SSTU32864EZKER
IC 25BIT CONFIG REG BUFF 96-BGA
|
- | Tape & Reel (TR) | Obsolete | Surface Mount | 96-LFBGA | 96-PBGA MICROSTAR (13.6x5.6) | 0°C ~ 70°C | 1:1, 1:2 Configurable Registered Buffer | 1.7V ~ 1.9V | 25, 14 |
|
|
SNJ54BCT8373AJT
SCAN TEST DEVICES WITH OCTAL D-T
|
54BCT | Tube | Active | Through Hole | 24-CDIP (0.300", 7.62mm) | 24-CDIP | -55°C ~ 125°C | Scan Test Device with D-Type Latches | 4.5V ~ 5.5V | 8 |
|
SN74LVT8996DWR
IC 10-BIT SCAN PORT XCVR 24-SOIC
|
74LVT | Tape & Reel (TR) | Active | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | -40°C ~ 85°C | Addressable Scan Ports | 2.7V ~ 3.6V | 10 |